Scanning electron microscopy
Scanning electron microscopy in combination with energy dispersive X-ray spectroscopy (REM / EDX)
Scanning electron microscopy is a nondestructive imaging process.
The Untserschid to the light microscope: The imaging is done by scanning the sample with electron beams.
Applications:
- Structure, structure of the material
- structural changes
- chemical composition of the constituents of a material
- impurities, inclusions
- Porosity, pore distribution
- Cracks and crack distribution
Material and material changes due to reactions taking place within the materials, caused e.g. due to temperature effects
- Material and material changes by reactions with foreign components, e.g. corrosive media, slags
- Infiltration and deposits
- Corrosion phenomena
- mechanical damage
- Defects, material defects
- manufacturing and processing errors
- Appraisals of layers
- Surface ratings
